"Techniques and technologies of Surface Scanning Probe Microscopy (SPM).

TYPESolid State Institute Seminar
Speaker:Mr. Chene Tradonsky
Affiliation:Dept. of Physics and Solid State Institute
Location:Solid State Auditorium(Entrance)
Remark:M.Sc. Student of Professor David Gershoni)

Recent technological advances made it possible to physically probe objects with atomic spatial resolution. Surface Scanning Probe Microscopy (SPM) uses a physical probe that scans the specimen to form images of surfaces and provides extensive options for nanometer-scale experiments. Atomic force microscopy (AFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of nanometers. Two leading research technologies that integrate well with AFM scanner are Near-field Scanning Optical Microscopy (or SNOM), Raman and Tip Enhanced Raman Spectroscopy (TERS). In my talk I will describe how these technologies are applied in Nanonics Imagingand discuss the scientific and technological challenges associated with them.