The Faculty inaugurated the new and advanced Atomic Force Microscopy experiment in the advanced physics labs, Built with the generous donation of KLA.

 

Atomic force microscopy (AFM) is a form of scanning probe microscopy (SPM). It offers fascinating insights into structures below the resolution limits of optical microscopy and therefore into the world of nanostructures. The scanning method is based on a fine scanning probe, which consists of a flexible arm called a cantilever that supports a tip with a radius less than 10 nm. As the tip interacts with the surface of a sample, the deflection of the cantilever is recorded in order to create an elevation profile of the surface line by line.

 

KLA is the world leader in metrology and inspection for the semiconductor manufacturing industry. As the KLA products enable measurements with sub-nanometer precision and accuracy, KLA is constantly searching for technologies, such as AFM, capable of these extreme requirements